Asymmetry of Fe-Co-Ni  (PDF)
This set of spectra, shown with a background only and shown with peak-fits, reveals the subtle inner band nature of these transition elements that does not match the simple Duniach-Sunjic asymmetry. Feel free to reference XPS International web-site page:    All copyrights reserved.

Charge Control on 5800 (PDF)
This set of spectra show how the mesh-screen method can be used to simplify and improve charge compensation on the PHI 5800 XPS instrument. Feel free to reference XPS International web-site page:  All copyrights reserved.

REELS on Pure Hydrocarbon (PDF)
Refected Electron Energy Loss Spectroscopy is a known, but not well explored technique.  This set of overlaid spectra reveal the significant potential of the technique since it can be readily used on insulators as well as all other materials. Feel free to reference XPS International web-site page:  All copyrights reserved.

Mono vs Non-Mono X-rays  (PDF)
Depending on the X-ray source, the rate and nature of the damage during analysis is different. The reason is that the Non-Mono source produce heat (100-200C) and high energy X-rays (up to 12 KeV) - also known as Bremmstrahlung. Damage is due to loss of elements and bond rearrangement.

Detection Limit Chart  (PDF)
This chart shows the connection between atom%, PPM, atoms/cm3 and does (atomms/cm2, along with the limits for analysis area, film thickness, depth of information, elements detected and quantitative accuracy.  Free to reference XPS International web-site page: All copyrights reserved.

Drawing of Relative Beam Sizes  (PDF)
The smallest analytical beam sizes for the techniques:  AES, D-SIMS, EDX, GD-OES, LEXES, ToF-SIMS, TR-XRF and XPS are shown. To enhance relative perception, two magnifications were needed. Free to reference XPS International web-site page: All copyrights reserved.

Optimizing # Scans vs S/N  (PDF)
Based on a detailed analysis of the signal to noise ratio vs number of scans for a series of spectra from pure silver, the most time-effective "S/N to time"  ratio (aka: figure of merit) occurs at 4 scans for a modern monochromatic XPS system.  All copyrights reserved.

Statistical Analysis of NIST BEs
A statistical analysis of pure elements and chemical compounds of reactive elements reveals the large errors and uncertainties that exist throughout the NIST SRD20 XPS Database of XPS BEs. This is due to the inherent nature of the reference literature and the lack of reivew by journal editors.:   All copyrights reserved.

Older Application Notes in Blue

Fundamental XPS Data  (PDF)
Reliable Binding Energiess and FWHMs from Pure Elements, Pure Metal Oxides and Chemical Compounds. Click to view parts of the PDF file.  Available in various sizes:  laminated Letter size, 11x17",  2x3 ft,  3x5 ft,  4x6 ft  wall and desk charts. Feel free to reference XPS International web-site page. All copyrights reserved.

Contamination by Gloves
Atom % data which indicates plastic gloves may cause contamination of items touched by plastic & clean room gloves.  Many gloves contain elastomers (silicone) that can easily transfer onto products.  Feel free to reference XPS International web-site page:   All copyrights reserved.

Binding Energy Table  (PDF)
A "BE Look-Up" table of 1,300 photoelectron and Auger signals derived from our XI Library of XPS Spectra  (Al K-alpha). Click here for HTML version. Feel free to reference XPS International web-site page. All copyrights reserved.

Carbide C 1s  BEs  (PDF)
Carbide, Metal Carbonyl & Hydrocarbon C 1s BEs formed after ion etching pure elements.  PDF file in Periodic Table format.  This is a one of a kind source of such data.  Feel free to reference XPS International web-site page.  All copyrights reserved.

Native Oxides  (PDF)
The amount of carbon and oxygen found on naturally formed native oxides follows a rough trend. Study this table to learn more about the natural passivation of the elements.  Feel free to reference XPS International web-site page.  All copyrights reserved.

Hydrocarbon BEs  (PDF)
Large differences sometimes occur between the C 1s BE of hydrocarbons adsorbed on native oxides & hydrocarbons on freshly ion etched metals.  Feel free to reference XPS International web-site page.   All copyrights reserved.

Auger KEs Table  (PDF)
This table lists reliable KEs obtained with a VG 310F AES system that uses a SSA. These KE values are the same as obtained by XPS systems using HSA.  Feel free to reference XPS International web-site page. All copyrights reserved.

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Feel free to reference XPS International web-site page:  http://www.xpsdata.com/xpsdata.htm   All copyrights reserved.