XPS
International

Applications

754 Leona Lane
Mountain View 
California, 94040, USA
FAX: -1-650-961-8591
E-mail: sales@xpsdata.com

  
 

 

 

A-Z Applications of SpecMaster Database Systems
 

 

With an organized library of more than 40,000 self-consistent monochromatic XPS spectra obtained from several hundreds of commonplace materials, SpecMaster data-base users will greatly improve the reliability and accuracy of their chemical species assignments and the information derived from those assignments. Data interpretations, analyses, and reports will be easier and more reliable with less guesswork because SpecMaster users can compare complete sets of correlated, real spectra not just one or two BE numbers obtained from two different sources with two different XPS instruments.  Comparisons with practical, real world, reference spectra allow users to easily and quickly verify the reliability or accuracy of spectra obtained from in-house XPS systems.  View Why We Made SpecMaster,

 

XI SpecMaster data-base systems provide the missing Carbon 1s spectra, Oxygen 1s spectra, survey spectra and other related spectra from all kinds of insulators that allow users to adjust, check or correct for charge-up in a variety of ways. Without original C 1s, O 1s and survey spectra, it is difficult to maximize the reliability and accuracy of in-house spectra. If we only use simple BE numbers, obtained from hundreds of different sources with different reference energies, then we lower data reliability and the quality of the derived information.

 

To make the interpretation of spectra easier, we made Spectral Data Processor, SDP v4.3, an advanced data software that can peak-fit, plot, shift, smooth, overlay, differentiate, scale, quantitate etc. to fully analyze complete sets of real world XPS spectra.

 

SpecMaster users can avoid many of the pit-falls and problems of various experimental methods by simply reviewing the discovered data trends and series of spectra contained in our Practical Studies library.

 

With the XI SpecMaster and XI SpecStarter systems users can perform the following real world applications and tasks:

 

  1. Compare thousands of real-world XPS spectra to check, confirm, and analyze in-house spectra

  2. Use complete sets of practical XPS spectra Not Just BEs that often have large error fanges

  3. Review and/or learn from our peak-fitted results stored in many of our data-files

  4. Determine or review FWHM and BE values not available in most other XPS reference sources

  5. Use our FWHM values to find hidden contaminants and to improve peak-fitting results

  6. Make hard or soft copies of complete sets of XPS reference data for your In-House Reports

  7. Study and avoid various real world phenomena/problems that may affect in-house results

  8. Study the adverse effects of using low voltage electron flood gun on grounded native oxides

  9. Teach students or new colleagues by working with complete sets of real world XPS spectra

  10. Study X-ray induced damage results from polymers and various binary metal oxides

  11. Review argon ion beam damage on binary metal oxides and chemical compounds

  12. Study the contamination transferred to industrial parts by handling those parts with Plastic Gloves

  13. Overlay your spectra with XI’s spectra by importing your data into the XI Data System**

  14. Overlay your spectra with XI’s spectra by exporting XI data into your system’s Data Format**

  15. Compare valence band reference data from semiconductors, binary metal oxides, or pure metals

  16. Review the results of depth profiles on Real World Multi-layered Materials

  17. Check the typical contaminants on real world materials as supplied by the chemical producers

  18. Study angle resolve XPS analyses of various native oxides

  19. Study the results o irradiating materials with a CW Laser while performing XPS at the same time

  20. Use our thousands of real spectra to test theories, theoretical results or derive XPS algorithms

  21. Analyze XI’s XPS spectra to check trends or to discover new trends

  22. Study reactions that occur between ion etched metals and residual gases in cryo-pumped UHV

  23. Use complete sets of XPS spectra to verify data interpretations and chemical state assignments

  24. Study the effects of allowing the X-ray beam to graze the surface of various materials

  25. Study the transmission function and stability of our XPS instrument and yours

  26. Study the reactions of materials implanted with various reactive gases (O2, CO, N2)

 

 

Note:  XPS BEs in some XPS handbooks and simple numerical databases are usually simple collections of spectra from pure elements only and/or simple tables of BE numbers for individual chemical species.  These handbooks and simple numerical databases can sometimes be useful, but they do not contain actual spectra for the main chemical species of interest.  In those types of simple handbooks and simple numerical databases there are no data whatsoever for closely related species or other signals such as the O 1s, C 1s, Auger signals, valence band spectra, or wide scan spectra which are essential to make reliable and accurate chemical species assignments. And finally, simple handbooks do not contain FWHM or atom % data, which can greatly assist users to interpret raw data.

 

**These features for importing and exporting data are currently available in rough form.  To use these features at this time the user must have access to software such as Microsoft ExcelTM, Grams 32TM, KaleidagraphTM, OriginTM etc.